May 2009JEOL USA Inc.Request Info
JEOL USA Inc. has unveiled an atomic resolution scanning transmission electron microscope (STEM). The 200-kV aberration-corrected JEM-ARM200F analytical microscope achieves high-angle annular dark-field resolution of 0.08 nm. It enables atom-by-atom imaging resolution and high spatial resolution for atom-to-atom chemical mapping of materials. The shielding design protects the ultrahigh-power optics from airflow, vibration and acoustical interference, and additional shielding protects against electronic interference, magnetic fields and thermal fluctuations.