Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

ABERRATION-CORRECTED STEM

Photonics Spectra
May 2009
JEOL USA Inc.Request Info
 
JEOL.jpgJEOL USA Inc. has unveiled an atomic resolution scanning transmission electron microscope (STEM). The 200-kV aberration-corrected JEM-ARM200F analytical microscope achieves high-angle annular dark-field resolution of 0.08 nm. It enables atom-by-atom imaging resolution and high spatial resolution for atom-to-atom chemical mapping of materials. The shielding design protects the ultrahigh-power optics from airflow, vibration and acoustical interference, and additional shielding protects against electronic interference, magnetic fields and thermal fluctuations.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
atomic resolution scanning transmission electron microscopeBasic ScienceJEOL USA Inc.MicroscopyNew Products

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!
X
Are you interested in this product?
If you'd like JEOL USA Inc. to reach out to you with more information about this product, please supply your email and they will contact you.

Email Address:
Stop showing me this for the remainder of my visit