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Force microscopy

Feb 2008
Asylum ResearchRequest Info
Asylum Research Corp. has introduced the Piezo Force Module for use with its MFP-3D atomic force microscope. Consisting of a high-voltage amplifier as well as high-voltage cantilever and sample holders, the device enables piezoresponse force microscopy measurements with a programmable bias of up to ±220 V with a 30-V/μs slew rate. The module comes with software for four imaging and two spectroscopy applications, including dual-frequency resonance tracking and single-point hysteresis loop measurements. The instrument provides crosstalk-free measurements on biological systems in fluids.


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