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3XB Scan Head

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Dual-Wavelength Large-Field Scan Head
Nutfield Technology Inc. has announced the 3XB dual-wavelength large-field three-axis scan head that offers smaller spot sizes and larger scan fields than can be achieved with f-Theta lenses.

Dual-wavelength technology allows systems designers and those working in R&D to employ a single scan head for use with both 532- and 1064-nm lasers, providing an economic advantage by reducing scan head inventories for situations where both wavelengths are used. Nutfield3XB-Scan-Head.jpg

The scan heads offer small spot diameters and large scan fields. At 532 nm, the spot diameter is 7µm with a 150 × 150-mm field, and 19 µm at 500 × 500 mm. At 1064 nm, the spot diameter at 150 × 150 mm is 14 µm, and at 500 × 500 mm, it is 38 µm.

Scan field and spot size can be adjusted by simply turning a knob to vary the spacing between the translator and the objective lens, allowing system designers to experiment with and dial in the optimum field/spot size combination for their applications. The lens translator houses an expander lens that accepts a beam from the laser source. The beam expands and travels through an objective lens that lies in front of the X-Y scan mirrors in a “post objective scanning” configuration. The expander lens moves linearly along the axis of the beam to correct for focus in real time as a function of an X-Y position within the scan field.

The scan heads are available in 10-, 15-, 20-, 30- and 45-mm apertures. They are available for fiber lasers and in open kit form. The integrated design leverages proprietary galvo technology to offer high bandwidth, accuracy and flexibility in three-axis technology.

Applications include scribing, edge deletion, grooving, cutting, marking and engraving.

For more information, visit: www.nutfieldtech.com  

Nutfield Technology Inc.
49 Range Road
Windham, N.H. 03087
Phone: (603) 893-6200
Fax: (603) 893-6214


Published: August 2009
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