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Microspectra 10
Oct 2009
CRAIC TechnologiesRequest Info
UV-VIS-NIR Spectrophotometer
SAN DIMAS, Calif., Oct. 1, 2009 – Craic Technologies Inc. has announced the Microspectra 10 UV-VIS-NIR microscope spectrophotometer designed to be added to the open photoport of any optical microscope to enable acquisition of spectra of microscopic samples. It also can be used to upgrade a legacy microspectrometer or to add spectroscopic and film-thickness capabilities to a probe station.

Craic.Microspectra.jpgDepending upon the microscope's configuration, the spectrophotometer performs UV-VIS-NIR range spectroscopy by absorbance, transmission, polarization, reflectance and fluorescence. Applications include quality control of LCDs, flat panel display color masks, organic and flat panel LEDs, MEMS devices, surface plasmon resonance, vitrinite reflectance of coal and coke, mineralology, photoreceptors, semiconductors, optical film thickness, process contamination analysis and thin-film thickness measurements of photovoltaic cells. Combined with the company’s traceable microspectrophotometer standards and sophisticated spectral analysis software, the device performs nondestructive microscale spectral analysis in the laboratory.

The system features a thermoelectrically cooled array detector for low noise and long-term stability, an advanced spectrophotometer, a color imaging system and the interface hardware for a microscope's photoport. It is designed to attach to the open photoport via a proprietary universal adapter that can also be used to parfocal and parcenter the imaging system image with that seen in the eyepieces. Such a design can add spectroscopic capabilities to an optical microscope or even be used to upgrade an older microspectrophotometer to the latest electronics, optics and software.

The combination of the spectrophotometer, the microscope and the easy-to-use software allows the scientist to analyze all manner of microscopic samples. The system offers high sensitivity, multiple analytical techniques and variable sample measurement areas.

For more information, visit:  

Craic Technologies Inc.
948 N. Amelia Ave.
San Dimas, CA 91773
Phone: (310) 573-8180
Fax: (310) 573-8182


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The natural log of the ratio of absorbed intensity over the total intensity which gives a constant value assuming a stable volume as well as energy. In optical physics the absorbance may be defined as the absorption cross section multiplied by the absorbing material length.
The emission of light or other electromagnetic radiation of longer wavelengths by a substance as a result of the absorption of some other radiation of shorter wavelengths, provided the emission continues only as long as the stimulus producing it is maintained. In other words, fluorescence is the luminescence that persists for less than about 10-8 s after excitation.
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With respect to light radiation, the restriction of the vibrations of the magnetic or electric field vector to a single plane. In a beam of electromagnetic radiation, the polarization direction is the direction of the electric field vector (with no distinction between positive and negative as the field oscillates back and forth). The polarization vector is always in the plane at right angles to the beam direction. Near some given stationary point in space the polarization direction in the beam...
The ratio of reflected flux to incident flux. Unless otherwise specified, the total reflectance is meant; it is sometimes convenient to divide this into the sum of the specular and the diffuse reflectance.
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