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Microscope System

Oct 2009
Veeco Instruments Inc.Request Info
Veeco.jpgThe Dimension Icon P series atomic force microscope (AFM) systems have been unveiled by Veeco Instruments Inc. With the introduction of the Icon-PT and Icon-PI AFMs, users can purchase a scalable Icon platform with the same microscope head, low drift and low noise necessary to produce artifact-free images in minutes. The Icon-PI produces high-resolution 1 k × 1 k images and is designed for use on a vibration isolation table. The Icon-PT offers high-speed data capability and user-configurable lock-in amplifiers, and it features 5 k × 5 k images as well as a set of options, including a heater, a cooler and proprietary thermal analysis technology.


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AFMartifact-free imagesatomic force microscopeBasic ScienceBiophotonicsBreakthroughProductsDimension Icon PIcon-PIIcon-PTimaginglock-in amplifiersmicroscope headMicroscopythermal analysisVeecoVeeco Instruments Inc.vibration isolation table

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