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Dimensional Measurement

EuroPhotonics
Oct 2009
STILRequest Info
 
STIL_SA.jpgStil SA’s Stil Duo sensor provides two optical principles for simultaneous dimensional measurement: the “confocal chromatic” and the “white light spectral interferometry.” With a wide range of optical pens, the former’s measurement dynamics range from 20 μm to 25 mm and can be performed on any type of material, including opaque, transparent, reflective and diffusing. The spectral interferometry process allows access to subnanometric resolutions for topography measurements that can be performed within a scale of up to 150 μm. The sensor is insensitive to vibrations.


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confocal chromaticdiffusingdimensional measurementEuropeopaqueoptical pensoptical principlesopticsProduct PreviewreflectivesensorSensors & Detectorsspectral interferometryStil DuoSTIL SAsubnanometricTest & Measurementtopographytransparentwhite light

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