Request InfoFor Photovoltaic MeasurementMKS/NewportIRVINE, Calif., Oct. 28, 2009 – Newport Corp.’s Oriel Instruments division has announced the Oriel IQE-200, an instrument that permits simultaneous measurement of both the external quantum efficiency (EQE) and the internal quantum efficiency (IQE) of solar cells, detectors and any photon-to-charge converting devices. The integrated and patent-pending measurement system incorporates detector geometry that splits the beam, allowing for concurrent measurements. Wavelength range is from 300 to 1100 nm, working distance is 50 mm, resolution is 5 nm (adjustable), and repeatability is <±0.5. The light source is a 250-W...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra October 2023 IssueWafer Measurement SystemThe NEXIV VMZ-NWL 200 from Nikon is an automatic wafer measurement system developed to solve the challenges of wafer metrology in the back-end of the semiconductor manufacturing process. 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