ETΦ LED Measurement Systems
Nov 2009Orb OptronixRequest Info
KIRKLAND, Wash., Nov. 4, 2009 – A new family of advanced LED characterization systems has been announced by Orb Optronix Inc. The ETΦ family, also known as ETO, measures the complete electrical, thermal and optical characteristics of LEDs.
As part of the design process, product development engineers must predict the performance of their LED systems and determine if they will meet specifications at real operating temperatures and under real electrical drive conditions. To do this, they must have a means of collecting data.
The LED characterization systems efficiently measure the quantity and color of light from LEDs over a range of temperatures and electrical input power variables. The systems include automated data acquisition and mature data analysis features, and they allow engineers to automatically sequence measurements of light output and spectra over a wide range of temperatures and currents. Comprehensive data analysis features allow users to quickly and easily view different groupings of data in more than 300 graphs.
The systems enable measurement and analysis of necessary parametric performance metrics on statistically relevant LED sample sizes easily and automatically.
LEDs’ light output, wavelength, chromaticity, correlated color temperature, forward voltage and efficacy change with respect to temperature, current, duty cycle and frequency. It is critical to understand these performance metrics in order for LED manufacturers to improve the design of LED packages as well as for users to design thermal and color management systems in solid-state lighting products.
The systems are available with options for integrating sphere sizes from 0.15 m to 1.93 m, a range of source meters and thermal platforms built for the measurement of discreet LED packages or high-power LED arrays and solid-state lighting subassemblies.
Models are offered in 1024- and 2048-pixel resolution, in spectral ranges of 380 to 780 nm, 250 to 500 nm and 360 to 1000 nm, and with optical bandwidths of 4.1 and 1.5 nm. Wavelength binning resolution is 1 nm, dynamic range resolution is 14 bit, typical flux measurement range is from 1 to 1000,000 lm, wavelength accuracy is ±0.5 nm, and wavelength repeatability is ±0.2 nm. Stray light is <10-3.
For more information, visit: www.orboptronix.com/eto
Orb Optronix Inc.
1003 7th Ave.
Kirkland, WA 98033
Phone: (425) 605-8500
Fax: (801) 912-2645