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Nov 2009
CRAIC TechnologiesRequest Info
Optical PV Cell Testing System
SAN DIMAS, Calif., Nov. 10, 2009 – Craic Technologies has announced the QDI 2010 PV, a microspectrophotometer designed to measure the transmission and reflectance of photovoltaic cells whether traditional crystalline silicon, the thin-film variety or components such as super- and substrates. Protective glass and concentrator modules also can be analyzed.

CRAIC_QDI.jpgThe UV/VIS/NIR system enables the user to determine thin-film thickness of microscopic sampling areas on both transparent and opaque substrates. It can be combined with proprietary contamination imaging capabilities to locate and identify process contaminants.

The microspectrophotometer combines advanced microspectroscopy with sophisticated software to enable the user to measure transmissivity, reflectivity and luminescence. It can determine the thin-film thickness by either transmission or reflectance of many types of materials and substrates and can measure the transmissivity and reflectivity from many of the components used to manufacture photovoltaic cells.

Transmission, absorbance, reflectance, polarization, emission and fluorescence spectra of samples ranging from >100 µm to <1 µm across can be measured. While microspectra are being acquired, the sample can be viewed simultaneously with a high-resolution digital imaging system or through eyepieces with the DirecVu package and research-grade optics.

Designed for the production environment, the instrument performs nondestructive measurements and incorporates a number of easily modified metrology recipes, the ability to measure new films and materials as well as sophisticated tools for analyzing data.

The integrated thermoelectrically cooled array detector ensures low noise and long-term stability. Optional hardware includes automation and specialized analysis packages, and optional software includes specialized data analysis, databasing and imaging.

For more information, visit:  

Craic Technologies
948 North Amelia Ave.
San Dimas, CA 91773
Phone: (310) 573-8180
Fax: (310) 573-8182


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The natural log of the ratio of absorbed intensity over the total intensity which gives a constant value assuming a stable volume as well as energy. In optical physics the absorbance may be defined as the absorption cross section multiplied by the absorbing material length.
The emission of light or other electromagnetic radiation of longer wavelengths by a substance as a result of the absorption of some other radiation of shorter wavelengths, provided the emission continues only as long as the stimulus producing it is maintained. In other words, fluorescence is the luminescence that persists for less than about 10-8 s after excitation.
See fluorescence; phosphorescence.
The science of measurement, particularly of lengths and angles.
A specialized spectrophotometer for use through a microscope on very small areas of an object.
The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
With respect to light radiation, the restriction of the vibrations of the magnetic or electric field vector to a single plane. In a beam of electromagnetic radiation, the polarization direction is the direction of the electric field vector (with no distinction between positive and negative as the field oscillates back and forth). The polarization vector is always in the plane at right angles to the beam direction. Near some given stationary point in space the polarization direction in the beam...
The ratio of reflected flux to incident flux. Unless otherwise specified, the total reflectance is meant; it is sometimes convenient to divide this into the sum of the specular and the diffuse reflectance.
The ratio of the intensity of the total radiation reflected from a surface to the total incident on that surface.
The internal transmittance per unit thickness of a nondiffusing material.
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