Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

Microspectrophotometer

Photonics.com
Nov 2009
CRAIC TechnologiesRequest Info
 
Optical PV Cell Testing System
SAN DIMAS, Calif., Nov. 10, 2009 – Craic Technologies has announced the QDI 2010 PV, a microspectrophotometer designed to measure the transmission and reflectance of photovoltaic cells whether traditional crystalline silicon, the thin-film variety or components such as super- and substrates. Protective glass and concentrator modules also can be analyzed.

CRAIC_QDI.jpgThe UV/VIS/NIR system enables the user to determine thin-film thickness of microscopic sampling areas on both transparent and opaque substrates. It can be combined with proprietary contamination imaging capabilities to locate and identify process contaminants.

The microspectrophotometer combines advanced microspectroscopy with sophisticated software to enable the user to measure transmissivity, reflectivity and luminescence. It can determine the thin-film thickness by either transmission or reflectance of many types of materials and substrates and can measure the transmissivity and reflectivity from many of the components used to manufacture photovoltaic cells.

Transmission, absorbance, reflectance, polarization, emission and fluorescence spectra of samples ranging from >100 µm to <1 µm across can be measured. While microspectra are being acquired, the sample can be viewed simultaneously with a high-resolution digital imaging system or through eyepieces with the DirecVu package and research-grade optics.

Designed for the production environment, the instrument performs nondestructive measurements and incorporates a number of easily modified metrology recipes, the ability to measure new films and materials as well as sophisticated tools for analyzing data.

The integrated thermoelectrically cooled array detector ensures low noise and long-term stability. Optional hardware includes automation and specialized analysis packages, and optional software includes specialized data analysis, databasing and imaging.

For more information, visit: www.microspectra.com  

Craic Technologies
948 North Amelia Ave.
San Dimas, CA 91773
Phone: (310) 573-8180
Fax: (310) 573-8182


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
Photonics Buyers' Guide
Looking for Substrates? There are 53 companies listed in the Photonics Buyers' Guide.
Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.
absorbanceconcentrator modulesCraic TechnologiesCrystalline SiliconDirecVuemissionfluorescencegreen photonicsimagingluminescencemetrologymicrospectrophotometeropaque substratesopticsphotonicsphotonics.comphotovoltaic cellspolarizationProductsprotective glassQDI 2010 PVReflectancereflectivitySensors & DetectorssuperstratesTest & Measurementthin-filmtransmissiontransmissivitytransparent substratesUV/VIS/NIR

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
X
Are you interested in this product?
If you'd like CRAIC Technologies to reach out to you with more information about this product, please supply your email and they will contact you.

Email Address:
Stop showing me this for the remainder of my visit