Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

Spectrometer

Photonics Spectra
Dec 2009
B&W TekRequest Info
 
BWTek.jpgReleased by B&W Tek Inc. for use in near-IR applications, the Sol 2.5 InGaAs linear array spectrometer covers the wavelength range from 1700 to 2500 nm and features enhanced thermoelectric cooling and low-noise readout electronics for longer integration times. It offers four sensitivity and dynamic-range settings and a built-in 16-bit digitizer, and it delivers 9-nm FWHM spectral resolution. Readout speed is 1 MHz, data transfer speed is 3 ms per spectrum in fast acquisition mode, integration time is from 10 μs to >64 ms, and operating temperature is from 0 to 30 °C. The system is supplied with a USB 2.0 interface, with RS-232C available as an option. Applications include composition analysis and moisture content.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required
16-bit digitizerB&W Tekcomposition analysisfour dynamic range settingsfour sensitivy settingsInGaAslinear arraylow-noise readout electronicsmoisture contentNew ProductsRS-232C optionSol 2.5SpectrometerspectroscopyTE coolingTest & MeasurementUSB 2.0

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x Subscribe to Photonics Spectra magazine - FREE!
X
Are you interested in this product?
If you'd like B&W Tek to reach out to you with more information about this product, please supply your email and they will contact you.

Email Address:
Stop showing me this for the remainder of my visit