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X-ray Fluorescence Spectrometers

Photonics.com
Feb 2010
Fischer Technology Inc.Request Info
 
WINDSOR, Conn., Feb. 18, 2010 – The FischerScope X-Ray Conti 5000 instruments manufactured by Fischer Technology Inc. are energy-dispersive x-ray fluorescence spectrometers for in-line process control. They are designed for continuous nondestructive analysis of alloys and for measurement of thin layers and layer systems.

The series is best suited for use in the photovoltaics industry to measure the thickness and composition of copper indium gallium selenide, copper indium selenide and cadmium telluride. The photoactive layers on various substrates such as glass panels, thin metals and plastic foils can be measured.

For each application the x-ray source and the semiconductor detector can be customized for best results. For simple integration into production lines, the spectrometers are supplied with a standardized mounting flange. Various modular versions are available to measure in a vacuum or in ambient air. Very hot substrates with surface temperatures of up to 500 °C can be measured with an additional cooling flange.

Calibration is quick and easy with a master-piece directly in the production process. Due to a large aperture, state-of-the-art semiconductor detectors and a digital pulse processor, the spectrometers provide good repeatability combined with long-term stability. The necessity for recalibration is greatly reduced, saving time and effort.

The entire operation – the analysis of the measurement signals and the display of all information – is carried out by an evaluation PC with easy-to-use WinFTM software. Due to a versatile communication interface, all Conti 5000 instruments are easily integrated into industrial process control systems.


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