Apr 2010Vision Components GmbHRequest Info
ETTLINGEN, Germany, April 16, 2010 — Vision Components GmbH has introduced an intelligent camera that can record and process electroluminescence images for quality checks of solar wafers and photovoltaic modules.
The VC4067/NIR features photosensitive technology that provides high-precision images at wavelengths of up to 1100 nm, thanks to a unique sensor operation mode. It reliably detects and identifies defects such as cracks and micro cracks, shunts, circuit interruptions, faulty printing, edge breakage, contamination and disconnected fingers. The cost-efficient solution includes all image processing electronics and does not require cooling systems.
Featuring an integrated 400-MHz processor from Texas Instruments, the camera has computing power of 3200 million instructions per second. Its ?-in. CCD sensor delivers 1280 × 1024-pixel resolution, operating at a maximum frame rate of 14 fps and achieving a freely programmable exposure time from 5 µs to 17 s. It is supplied with RS-232 and 100-Mb Ethernet interfaces and an external trigger input that enables jitter-free image capture, even at high reading frequencies.
Standard configuration also includes four digital programmable logic controller inputs, four outputs and an SXGA video output. Measuring just 110 × 50 × 35 mm, the camera can be easily integrated into applications where installation space is limited.
With the onboard processor, the images can be processed and/or preprocessed inside the camera to reduce data streaming and process time. Off-line and in-line solutions are possible, with cycle times of <1 s per cell.
Pixel size is 6.45 × 6.45 µm. Included is a programmable look-up input table.
For more information, visit: www.vision-components.com