Surface Metrology System
Veeco Instruments Inc.Request Info
The NT9080, a surface metrology system introduced by Veeco Instruments
Inc., uses white-light interferometry to measure surface topography nondestructively,
from nanometer-scale roughness through millimeter-scale steps, with subnanometer
vertical resolution and production-level throughput. Push-button analysis provides
instant feedback, and 3-D surface data is saved for subsequent characterization,
without requiring a new scan of the sample or part. The system is used in research
labs and in the precision machining, medical, printing and solar cell manufacturing
markets. With a small footprint, the 3-D measurement microscope accommodates a variety
of samples and feature sizes as small as 0.50 μm. Running on Vision software,
it provides access to more than 200 distinct analyses and more than 1000 critical
parameters for measuring curvature, lay, bearing ratio, wear and corrosion. Long-lifetime
green and white LEDs provide the light source.
https://www.veeco.com
/Buyers_Guide/Veeco_Instruments_Inc/c15663
Published: April 2010
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Veeco Instruments Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required