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Scanning probe

Nanonics Imaging Ltd.Request Info
 
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Nanonics Imaging Ltd. has unveiled the MV4000 scanning probe microscope, which can accommodate up to four probes. The microscope’s 3D FlatScanner piezoelectric scanning stage enables an X-Y scanning range of up to 160 μm and a Z-scanning range of up to 130 μm. The 5-nm probe size produces high resolution. The device can be used to perform near-field scanning optical and atomic force microscopies, and can be employed with techniques such as scanning electron and confocal microscopy and Raman spectroscopy.


Published: October 2006
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