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UltraXRM-L200 Microscope

Photonics.com
Aug 2010
Carl Zeiss X-ray Microscopy Inc.Request Info
 
CONCORD, Calif., Aug. 30, 2010 — A new computed tomography (CT) system that delivers synchrotronlike 3-D imaging at 50-nm resolution within a laboratory setting has been announced by Xradia Inc. The UltraXRM-L200 uses state-of-the-art x-ray optics originally developed for synchrotron research facilities to enable high resolution and efficiency in laboratory settings.

The microscope combines a high-flux laboratory x-ray source with proprietary x-ray optics into a stand-alone CT scanner. It is suitable for use in advanced materials development, life sciences studies for soft tissue and bone, rock porosity studies for oil and gas drilling feasibility models, and semiconductor package failure analysis.

The imaging system provides detailed 3-D volumetric data of internal structures without the need for cutting or sectioning at the region of interest and produces test results under a variety of conditions, including time-lapsed 4-D imaging.

With resolution of 50 nm, the instrument provides insight into microscopic structures and processes. Operating with 8-keV x-rays, it enables observation of structures and materials in their natural state.

Its nondestructive imaging enables repeated imaging of the same sample under different conditions and/or over time, to bring the fourth dimension – time – to analysis. Absorption and Zernike phase contrast modes allow imaging of a wide variety of sample types, from rocks to advanced materials to soft tissue. A large working distance and an atmospheric sample environment allow in-situ studies. Two magnifications are available: a 65-µm field of view at 150-nm resolution and a 15-µm field of view at 50 nm.


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