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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Vortis SPM Control Station

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Bruker Nano GmbH, JPK BioAFM
BERLIN, Germany, Sept. 13, 2010 — JPK Instruments AG has announced the Vortis Advanced fully digital scanning probe microscope (SPM) electronics control system with low noise and high signal speed. The company has used the new Power-PC hardware with the latest field-programmable gate array architecture to deliver high digital performance. Vortis Advanced is available with all of the company's SPM systems, enabling the NanoWizard 3, the ForceRobot 300 and the CellHesion 200 to deliver even better results. With fast signal acquisition and control, advanced feedback and analysis are the keys for a modular and...See full product

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