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eXcelon CCD Technology

Photonics.com
Sep 2010
Princeton InstrumentsRequest Info
 
TRENTON, N.J., Sept. 24, 2010 — Princeton Instruments has introduced eXcelon deep-depletion CCDs and cameras for low-light, near-infrared imaging and spectroscopy. Improvements over standard deep-depletion technology include reduced etaloning and higher quantum efficiency across a broader wavelength range from 200 to 1100 nm.

The new CCDs, with 1340 × 100-, 1340 × 400-, 1024 × 1024 and 1340 × 1300-pixel resolutions, are available in the company’s Pixis and Spec-10 deep-cooled, low-noise camera platforms.

Suitable for broad UV-NIR detection and for NIR Raman spectroscopy, solar wafer/cell inspection, NIR luminescence and astronomy, the back-illuminated CCDs provide good photon-detection capabilities. They are beneficial for applications requiring enhanced sensitivity in the blue and NIR regions. The sensors deliver peak quantum efficiency of >95% and as much as a 45% increase over a broader UV-NIR wavelength range.

With the new technology, the cameras are suitable for use in live-cell imaging, confocal imaging, total internal reflection fluorescence, Förster resonance energy transfer, Bose-Einstein condensate, and super-resolution techniques such as stochastic optical reconstruction microscopy and photoactivated localization microscopy.


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Americasastronomyback-illuminatedBasic ScienceBECBiophotonicsBose-Einstein condensatecamerasCCDconfocaldeep-cooleddeep-depletionenergyeXcelonFörster resonance energy transferFRETimagingKeywords: Princeton Instrumentslive-cell imaginglow-lightMicroscopynear-infraredNIR luminescenceNIR RamanopticsPALMphotoactivated localizationphoton detectionPIXISProductsSensors & Detectorssolar cellsolar waferSpec-10spectroscopystochastic optical reconstructionSTORMTIRFtotal internal reflection fluorescenceUV-NIRWafers

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