Request InfoHiden Analytical Ltd.WARRINGTON, England, Oct. 4, 2010 — Hiden Analytical Ltd. has upgraded its SIMS (secondary ion mass spectrometry)/SNMS (sputtered neutral mass spectrometry) workstation for high-sensitivity static and dynamic surface analysis. Applications range from photovoltaics, metallurgy, semiconductors and thin-film studies to geology and gemstone characterization. The sample loading and sample transfer stages with fast-entry load lock enable preloading and reloading of multiple samples for optimum cost-effective operational efficiency. The system is fully ultrahigh-vacuum-compliant, with a choice of oxygen, argon and caesium ion...See full productRelated content from Photonics MediaPRODUCTSPhotonics Spectra August 2022 IssueLadar-Based Metrology SystemThe DYNAMIC 9D laser detection and ranging (LADAR) system from Automated Precision Europe GmbH provides noncontact optical dimensional metrology for manufacturing uses. 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