Oct 2010Veeco Instruments Inc.Request Info
Veeco Instruments Inc. has unveiled the Dimension Edge atomic
force microscope (AFM) system for physical and life sciences applications. It features
hardware and software advances that reduce the time required to produce expert-level
data, providing a seamless path from sample placement through optical identification
of the region of interest, and from AFM survey mode to zoomed-in feature identification.
The proprietary closed-loop and drift-compensated stage combines productivity, accuracy
and sample versatility with acquisition of high-resolution images. With low noise
levels, the system enables collection of fine details critical for material identification,
while protecting tips and samples and diminishing tip artifacts. A variety of AFM
modes provides the accurate imaging and single-point spectroscopy capabilities required
for characterization of solar and semiconductor devices, mapping of heterogeneous
polymer-based materials, interrogation of individual nanoparticles and in situ imaging
of life sciences samples from single molecules to whole cells.