Nov 2010Hiden Analytical Ltd.Request Info
Hiden Analytical Ltd. has upgraded its SIMS/SNMS (secondary ion
mass spectrometry/sputtered neutral mass spectrometry) workstation for high-sensitivity
static and dynamic surface analysis. Applications range from photovoltaics, metallurgy,
semiconductors and thin-film studies to geology and gemstone characterization. The
sample loading and sample transfer stages with fast-entry load lock enable preloading
and reloading of multiple samples for optimum cost-effective operational efficiency.
The system is fully ultrahigh-vacuum-compliant, and with oxygen, argon and cesium
ion sources, provides for broad-beam applications and fine-focus operation to a
20-μm spot size. It also offers elemental analysis of both electropositive
and electro-negative species. Included in the system are electron beam charge compensation,
a CCD camera and an enclosure. The multiported vacuum chamber is fully accessible
for mounting additional accessories.