Request InfoHiden Analytical Ltd.Hiden Analytical Ltd. has upgraded its SIMS/SNMS (secondary ion mass spectrometry/sputtered neutral mass spectrometry) workstation for high-sensitivity static and dynamic surface analysis. Applications range from photovoltaics, metallurgy, semiconductors and thin-film studies to geology and gemstone characterization. The sample loading and sample transfer stages with fast-entry load lock enable preloading and reloading of multiple samples for optimum cost-effective operational efficiency. The system is fully ultrahigh-vacuum-compliant, and with oxygen, argon and cesium ion sources, provides...See full productRelated content from Photonics MediaPRODUCTSVision Spectra Winter 2023 Issue10 GigE Cameras10 GigE uEye Warp10 camera models from IDS Imaging Development Systems GmbH feature onsemi XGS sensors up to 45 MP for industrial automation. 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