BER/Eye Pattern Test Solution
Dec 2010Anritsu Co.Request Info
RICHARDSON, Texas, Dec. 29, 2010 — Newly introduced hardware options for Anritsu Co.’s MP2100A Bertwave series allow the compact instruments to support bit-error-rate (BER) measurements and eye pattern signal analysis between 125 Mb/s and 12.5 Gb/s.
The new options create an all-in-one efficient test solution that can conduct highly accurate measurements on optical modules, cables and connectors during the R&D and manufacturing stages.
The new options add support for next-generation 10-Gb-band devices while also offering evaluation of low-bit-rate active optical devices designed into communications systems. With the new options, the systems support all major optical standards, including 100BASE-FX, OC-3/STM and OUT-2. Additionally, they support LTE CPRI v4.1 bit rates (6.14, 4.92, 3.07, 2.46, 1.32 Gb/s) to conduct accurate and efficient LTE CPRI optical transceiver inspection tests.
High-accuracy extinction ratio measurements can be achieved, as one new option adds six built-in Bessel filters to the systems’ base unit. The filters are combined with the instruments’ built-in calibration function control measurement dispersion to assure extinction ratio measurements as close as possible to the true value.
The systems combine the measurement capability of a bit-error-rate tester (BERT) and an eye pattern analyzer, improving test efficiency and lowering test costs.
Further improving efficiency and throughput is the high-speed remote measurement capability that reduces BER measurement times by 30% to 10 ms. Measurement times are also improved by the instruments’ high-speed sampling, which enables acquisition of 100,000 samples in ~ 1 s. The systems also support automatic mask margin tests within 1 s.
Compact and lightweight, the devices measure 341 × 221 × 180 mm and weigh <7 kg, so they save valuable benchtop space. Additional cost savings are realized by the fact that they require only 300 VA of power.