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SU640KTS InGaAs SWIR Camera

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PRINCETON, N.J., Jan. 19, 2011 — Sensors Unlimited – Goodrich ISR Systems has announced a large-format InGaAs short-wavelength infrared (SWIR) snapshot video camera, the SU640KTS.

The compact and high-resolution imager has met all Conformite Europeene (CE) and US Federal Communications Commission standards for radiated and conducted emissions, for immunity from such emissions and for electrostatic discharge resistance. The CE mark ensures compatibility with the strictest country requirements for instruments delivered to European Union customers.

The camera operates from 0.9 to 1.7 µm at 30 fps. The solid-state, uncooled 640 × 512-pixel array camera with 25-µm pitch also features built-in nonuniformity correction, automatic gain control and adjustable automatic contrast enhancement. It offers both EIA-170 analog video output and Camera Link compatibility for 12-bit digital imaging. Extensive camera commands and controls are also available using the Camera Link interface or via a separate EIA232 interface for added flexibility.

For solar applications, the camera is suited for silicon block, silicon ingot and wafer inspection. Other applications include integrated circuit microscopy, machine vision of moving objects, sorting, inspection, hyper- and multispectral imaging, pulsed or continuous-wave laser-beam profiling, thermal imaging at >150 °C through glass windows, and full-field optical coherence tomography at 1.04, 1.31 and 1.55 µm.

The low-power (<2.5 W at 20 °C, 9 to 16 V) camera is supplied with a C-mount lens adapter. Options include a C-mount 25-mm f/1.4 lens, a Nikon 50-mm f/1.4 lens with an F-mount adapter, and a SWIR-optimized 50-mm f/1.4 lens with the Goodrich 42-mm interface adapter. Also available is an imaging pack consisting of a 2-m Camera Link cable and the National Instruments PCIe-1427 frame grabber card.


Published: January 2011
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adjustable automatic contrast enhancementAGCAmericasanalogautomatic gain controlBiophotonicsC-mountCamera LinkcamerasCECommunicationsConformite Europeenecontinuous-waveCWEIA-170EIA232energyFCCGoodrich ISR Systemsgreen photonicshyperspectral imagingImagingInGaAslarge-formatlaser beam profilingmachine visionMicroscopymultispectral imagingnonuniformity correctionNUCOCToptical coherence tomographyProductspulsedSensors & DetectorsSensors Unlimitedshort-wavelength infraredsilicon block inspectionsilicon ingot inspectionsilicon wafer inspectionSnapshotsolarsolid-stateSU640KTSSWIRTest & Measurementthermal imaginguncooledUS Federal Communications CommissionVideo

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