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Near-Infrared Spectrometers
Feb 2011
Photon Control Inc.Request Info
BURNABY, British Columbia, Feb. 24, 2011 — Photon Control Inc. has released the SPM-001-NIR1700S and SPM-001-NIR2500W spectrometers.

The high-resolution 140-mm-focal-length optical bench spectrometers feature a thermoelectrically cooled 512-pixel InGaAs linear array and are available with two different detectors to enhance the spectral range from 900 up to 2500 nm for expanding detection capabilities further into the near-infrared. The longer focal length allows the company to offer customization for both wide and very narrow spectral ranges.

The devices are well suited for a variety of applications such as mineral identification, process automation technology, laser characterization and tuning, thin-film thickness measurement, moisture measurement in wood fiber, reflectance, transmission, absorption, cellulose analysis, soil analysis, chemical analysis, sensors, alcohol content analysis, and petrochemical and pharmaceutical analysis.

They are equipped with an internal digital signal processing chip that can handle complex signal processing tasks, and they feature powerful software based on LabView which can be easily integrated into existing software using one of the company’s development kits. Other features include a 16-bit analog-to-digital converter and a USB interface that includes data logging and beam profiling.

The SPM-001-NIR1700S covers the spectral range from 900 to 1700 nm, and the 2500W, from 1250 to 2500 nm. Both feature Hamamatsu detectors, SMA fiber input, visible block order blocking filters, a maximum refresh rate of 50 Hz and an integration time ranging from 10 µs to 10 s. Both measure 244 × 90 × 53.4 mm and weigh 475 g.

The spectrometers work well with the proprietary SPL family of light sources and other accessories.


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The transfer of energy from an incident electromagnetic energy field with wavelength or frequency to an atomic or molecular medium.
optical bench
A support for optical parts comprising a solid bed that permits precise longitudinal movement of one component relative to the others, and a number of sliders equipped with holders for lenses, lamps, apertures, eyepieces, ground glass, etc. Scales often are provided to measure the movement of the various sliders. Some special-purpose benches carry a nodal slide and flat-field bar with a microscope carriage for lens testing. Two-dimensional benches have appeared recently that consist of a...
The ratio of reflected flux to incident flux. Unless otherwise specified, the total reflectance is meant; it is sometimes convenient to divide this into the sum of the specular and the diffuse reflectance.
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