New Interferometer for Dynamic Metrology
Mar 2011Zygo Corporation, Ultra Precision TechnologiesRequest Info
DynaFiz™ is a new instantaneous Fizeau-type interferometer
optimized for dynamic metrology in the presence of extreme vibrations and air turbulence.
The light, efficient design offers fast shutter rates to freeze disturbances, and
high spatial resolution for enhanced surface characterization. MetroPro™X
enables real-time Zernike analysis for dynamic testing of optical systems.