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Spectral Reflectivity Measurement

Photonics Spectra
Apr 2011
Olympus Scientific Solutions Americas, Industrial MicroscopesRequest Info
 
Olympus America Inc.’s Scientific Equipment Group offers a spectral reflectivity measurement system for lens design and manufacturing. The USPM-RU III is used with the lenses, prisms, flat glass, plastics and electronic components designed and produced by optical manufacturers. It provides accurate and repeatable measurements of thin samples within seconds. The system enhances quality control and R&D projects by providing accurate reflectivity measurements without the need for back-side coating. Spherical, aspherical, flat and other surfaces can be accommodated without costly or time-consuming sample preparation. The system provides comparison reflectivity measurements for wavelengths ranging from 380 to 780 nm, using a reference specimen.


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