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Dynamic Profiler

Photonics Spectra
May 2011
4D Technology CorporationRequest Info
 
For 3-D measurement of surface roughness on large polished optics and optical-quality surfaces, despite vibration or turbulence, 4D Technology Corp. has released the NanoCam Sq dynamic profiler. The instrument replaces the slow, messy replication methods required by traditional workstation interferometers. By enabling on-machine roughness metrology, it reduces handling and transportation of the optic, increasing throughput and reducing the risk of damage to expensive, mission-critical optics. It uses dynamic interferometry, incorporating a high-speed optical sensor that measures thousands of times faster than typical profilers, according to the company. Because acquisition time is short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on gantries or on robots. The system includes the profiler, computer system and 4Sight analysis software.


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2-Dmetrology3-D measurement4D Technology4Sight softwareAmericascoated opticsdata filteringDynamic Interferometrygantrieslarge polished opticsmaskingNanoCam SqNanoCam Sq dynamic profilerNew Productson-machine metrologyoptical quality surfacesopticspolishing equipmentprocess controlrobotsSensors & Detectorssurface roughnessTest & Measurementuncoated optics

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