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Dynamic Profiler

Photonics Spectra
May 2011
4D Technology CorporationRequest Info
 
For 3-D measurement of surface roughness on large polished optics and optical-quality surfaces, despite vibration or turbulence, 4D Technology Corp. has released the NanoCam Sq dynamic profiler. The instrument replaces the slow, messy replication methods required by traditional workstation interferometers. By enabling on-machine roughness metrology, it reduces handling and transportation of the optic, increasing throughput and reducing the risk of damage to expensive, mission-critical optics. It uses dynamic interferometry, incorporating a high-speed optical sensor that measures thousands of times faster than typical profilers, according to the company. Because acquisition time is short, the NanoCam Sq can measure despite vibration, making it possible to mount the instrument in polishing equipment, on gantries or on robots. The system includes the profiler, computer system and 4Sight analysis software.


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GLOSSARY
metrology
The science of measurement, particularly of lengths and angles.
coated optics
Optical elements that have been coated with one or more layers of dielectric, or metallic material. These coatings serve to reduce or increase reflection from the surface, and to protect the surfaces from fumes or abrasion. Magnesium fluoride, silicon dioxide, and zinc sulphide are a few of the most commonly used coating materials.
masking
In image processing, the assigning of certain portions (or pixels) of an image a constant value of either 0 (black) or 1 (white) as to restrict image processing operations to a specific set of pixels within the image based off of its numerical assignment; also, the process of outlining an image and then matching it to test images.
process control
The collection and analysis of data relevant to monitoring the rate and quality of industrial production, either continuously or in batches. Corrections can be made manually or automatically, via a feedback control loop.
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