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Dimension FastScan AFM
May 2011
Bruker Nano SurfacesRequest Info
SANTA BARBARA, Calif., May 5, 2011 — Bruker Corp. has announced the Dimension FastScan atomic force microscope (AFM), which delivers improved imaging speed without sacrificing nanoscale resolution. It produces results in seconds or minutes instead of hours or days.

The system performs large-sample atomic-scale imaging across the scientific, biological, semiconductor, data storage and energy research markets.

Technological innovations enable a balance of fast scan speeds, high image resolution and accuracy. Based upon the Dimension Icon AFM architecture, the microscope is a tip-scanning system that provides measurements on both large and small samples in air or fluids.

The system uses an X-Y-Z closed-loop head that scans at high speeds while delivering low drift and low noise. These features combine to cut stabilization times. A new fast scanner, a high-resolution camera, automated laser and detector alignment, and integrated feedback alignment tools deliver faster probe positioning and sample navigation, allowing users to locate features of interest more easily.

The software offers an intuitive workflow, while default experiment modes distill advanced AFM processes into preconfigured settings. Whether using the Icon scanner with ultralow noise and high accuracy to render subnanometer resolution and <30-pm vertical noise, or the FastScan scanner for high scan rates with nanometer resolution and <40-pm vertical noise, the Dimension FastScan system expands laboratory and industrial nanoscale microscopy capabilities.


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AFMairAmericasatomic force microscopeBasic SciencebiologyBiophotonicsBrukerCaliforniadata storageDimension FastScanDimension Iconenergy researchfluidsindustrialindustrylaboratorylarge samplesMicroscopynanoscale resolutionopticsProductssciencesemiconductorSensors & Detectorssmall samplesSoftwaretip-scanningX-Y-Z closed-loop head

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