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WS6-200 IR3 Wavelength Meter

Photonics.com
May 2011
TOPTICA Photonics Inc.Request Info
 
VICTOR, N.Y., May 11, 2011 — Toptica Photonics Inc. has introduced the WS6-200 IR3, a wavelength meter that performs wavelength measurements from 2 to 11 μm in the mid-infrared region with precision, speed and accuracy.

For use by scientists and engineers, the system calculates accurate measurements and, as with all other wavelength meters in the HighFinesse/Ångstrom series, enables continuous-wave and pulsed lasers with narrowband emission to be examined, monitored and actively controlled.

Based on a durable Fizeau interferometer setup with no moving components, the wavelength meter provides high performance, even under harsh conditions. Its high-sensitivity detector processes complex algorithms and enables single-pulse measurements up to a repetition rate of 150 Hz. A fiber input port for coupling the laser radiation into the wavelength meter ensures convenient handling.

The device connects easily to a computer with a fast USB interface. The fully automated system records long-term measurements and converts the data into different formats for subsequent evaluation; e.g., to precisely assess the long-term frequency stability of a laser system.

Multiple options include proportional integral derivative control, transistor-transistor logic synchronization and linewidth measurement.

The solid-state device delivers 200-MHz accuracy.


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Americascontinuous-wave lasersCWfiber input portFizeau interferometerHighFinesse/Ångstrom serieslinewidth measurementmid-infrarednarrowband emissionNew YorkPIDProductsproportional integral derivative controlpulsed lasersSensors & DetectorsTest & MeasurementToptica Photonicstransistor-transistor logic synchronizationTTLUSBwavelength meterWS6-200 IR3

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