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20/20 XL

Photonics.com
May 2011
CRAIC TechnologiesRequest Info
 
SAN DIMAS, Calif., May 13, 2011 — Craic Technologies Inc. has announced the 20/20 XL UV-visible-NIR microspectrophotometer designed to nondestructively analyze microscopic features of very large displays by incorporating large-scale sample handling. With a spectral range from the deep-ultraviolet to the near-infrared, it analyzes samples by absorbance, reflectance, luminescence and fluorescence with high speed and accuracy.

The system also can be configured to image microscopic samples in the UV and NIR. Applications include mapping color and intensity variations, film thickness measurements, microcolorimetry and scanning the surfaces of display components for defects. With its ability to spectrally analyze and image microscopic features of very large devices, the device is suitable for use in laboratories and manufacturing facilities.

It can take spectra and images of microscopic features of large flat panel displays and, with its ability to measure micron-size features, it can measure color and intensity of individual pixels.

The microspectrophotometer integrates a spectrophotometer with a UV-visible-NIR microscope and powerful, easy-to-use software. It is designed to attach to large sample handling frames. Features include touch-screen controls, calibrated variable apertures, high sensitivity, a durable design, and multiple imaging and spectroscopic techniques.


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20/20 XLabsorbanceAmericascalibrated variable aperturesCaliforniaConsumerCraic Technologiesfilm thickness measurementsfluorescenceimagingindividual pixelsindustriallarge displaysluminescencemapping color variationsmapping intensity variationsmicrocolorimetrymicroscopemicroscopic featuresMicroscopymicrospectrophotometernondestructive analysisProductsReflectanceSoftwarespectrophotometerTest & Measurementtouch screen controlsUV/VIS/NIR

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