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EDX-LE Spectrometer
May 2011
Shimadzu Scientific Instruments Inc.Request Info
COLUMBIA, Md., May 16, 2011 — The EDX-LE from Shimadzu Scientific Instruments Inc. is an energy-dispersive x-ray (EDX) fluorescence spectrometer designed for screening elements regulated by the RoHS/ELV directives. Its automated analysis functions improve operability without sacrificing a high level of inspection reliability.

The spectrometer is equipped with a detector that does not require liquid nitrogen, resulting in lower operational costs and easier maintenance. It has been optimized for high-speed RoHS/ELV screening of materials, individual parts and other samples that are substantially homogeneous. It is suited to screening a limited range of samples for fixed control criteria.

The time required from start of measurement to judgment is as short as 1 min for some samples. This is helpful in screening inspections for the five elements (bromine, cadmium, chromium, mercury and lead) regulated by the RoHS directive.

It offers various features that promote simple screening, and users can customize the easy setup functions according to the management method. Threshold values can be set for each material or element, and the screening judgment also can be changed according to the input method used for threshold values.

The device provides improved security for software operations. The condition protection function lets users set restrictions for screening conditions and other settings. The spectrometer also features an automatic x-ray tube-aging function to prevent malfunction in systems that have not been used for long periods of time.


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The emission of light or other electromagnetic radiation of longer wavelengths by a substance as a result of the absorption of some other radiation of shorter wavelengths, provided the emission continues only as long as the stimulus producing it is maintained. In other words, fluorescence is the luminescence that persists for less than about 10-8 s after excitation.
A kind of spectrograph in which some form of detector, other than a photographic film, is used to measure the distribution of radiation in a particular wavelength region.  
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