Atomic Force Microscope
Bruker Nano SurfacesRequest Info
The Dimension FastScan atomic force microscope (AFM) from Bruker
Corp. delivers good imaging speed without sacrificing nanoscale resolution. It produces
results in seconds or minutes instead of hours or days. The system performs large-sample
atomic-scale imaging across the scientific, biological, semiconductor, data storage
and energy research markets. Innovations enable fast scan speeds, high image resolution
and accuracy. Based upon the Dimension Icon AFM architecture, the microscope is
a tip-scanning system that provides measurements on large and small samples in air
or fluids. The system uses an X-Y-Z closed-loop head that scans at high speeds while
delivering low drift and low noise. A new fast scanner, a high-resolution camera,
automated laser and detector alignment, and integrated feedback alignment tools
deliver fast probe positioning and sample navigation.
https://www.bruker.com/nano
/Buyers_Guide/Bruker_Nano_Surfaces/c19385
Published: July 2011
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required