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Atomic Force Microscope

Jul 2011
Bruker Nano SurfacesRequest Info
The Dimension FastScan atomic force microscope (AFM) from Bruker Corp. delivers improved imaging speed without sacrificing nanoscale resolution. It produces results in seconds or minutes instead of hours or days. The system performs large-sample atomic-scale imaging across the scientific, biological, semiconductor, data storage and energy research markets. Based upon the Dimension Icon AFM architecture, the microscope is a tip-scanning system that provides measurements on large and small samples in air or fluids. The system uses an X-Y-Z closed-loop head that scans at high speeds while delivering low drift and low noise. These features cut stabilization times. A new fast scanner, a high-resolution camera, automated laser and detector alignment, and integrated feedback alignment tools deliver faster probe positioning and sample navigation.


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