Oct 1999Hinds Instruments Inc.Request Info
Hinds Instruments Inc.'s Exicor is a low-level birefringence mapping system for characterizing optical materials. Using the company's photoelastic modulator technology, Exicor measures the retardation of linear birefringence with a sensitivity of ±50 pm and the direction of birefringence with an accuracy of <1° for retardance greater than 0.5 nm. User-interface software guides the operator through the step measurement process for optical samples as large as 6 x 6 in. The system is suitable for quality-control applications in semiconductor photolithography; manufacturing of plate glass, scientific components, laser crystals and DVDs; and metrology.