Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

QI for AFM System

EuroPhotonics
Mar 2012
JPK Instruments AGRequest Info
 
JPK Instruments has announced new quantitative imaging (QI) capabilities for the recently launched NanoWizard 3 atomic force microscopy (AFM) system. The QI mode was developed by the company to facilitate AFM imaging. With QI, a force curve-based imaging mode, the user has full control over the tip-sample force at every pixel of the image. There is no need for set point or gain adjustment while scanning. Applying proprietary ForceWatch technology, QI delivers good results on soft (hydrogels or biomolecules), sticky (polymers or bacteria), loosely attached (nanotubes or virus particles in fluid) samples, or on samples with steep edges (powders, microelectromechanical systems structures). It is useful in areas that demand high resolution and force sensitivity, such as biology, polymers and surface science.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to JPK Instruments AG by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
Basic ScienceBiophotonicsBreakthroughProductsEuropeforce curve-based imaging modeForceWatch technologyGermanyimagingJPK InstrumentsMicroscopynanoNanoWizard 3 atomic force microscopeNew ProductsopticsProduct PreviewQI for NanoWizard 3 AFMQI-Advanced software packageQuantitative Imagingquantitative imaging bacteriaquantitative imaging biomoleculesquantitative imaging hydrogelsquantitative imaging MEMSquantitative imaging microelectromechanical systems structuresquantitative imaging nanotubesquantitative imaging polymersquantitative imaging powdersquantitative imaging real quantitative dataquantitative imaging virus particles in fluidquantitative measurement material adhesionquantitative measurement material dissipationquantitative measurement material stiffness

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com
x Subscribe to EuroPhotonics magazine - FREE!
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to JPK Instruments AG so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit