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OPTICAL METROLOGY TOOL

Photonics Spectra
Apr 1997
AMO WaveFront Sciences LLCRequest Info
 
WaveFront Sciences Inc. has introduced the Complete Light Analysis System - 2D, which provides quantitative measurements of both the intensity and phase of any optical source. This vibration-insensitive optical metrology tool is a low-cost baseline system with <l/100 resolution and >100-µm dynamic range. It is a complete, turnkey optical analysis system. Applications include beam profiling, quality control testing and screening, and on-line inspection. A portable version is also available.


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