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Photonics Spectra
Aug 2012
QED Technologies Inc.Request Info
ROCHESTER, N.Y., May 28, 2012 — QED Technologies International Inc. has released its QED Interferometer for Stitching (QIS) system.

Until now, the company’s metrology systems have used a general-purpose interferometer. Customer requirements have led to one with improved stitching algorithms.

The QIS incorporates hardware and software features that enhance the performance of the company’s metrology products. The proprietary QIS coherent imaging system provides measurements with higher fringe densities and greater contrast. The optical design reduces retrace and magnification errors, and the greater focus travel enables measurement of parts with shorter radii than is possible with a general-purpose interferometer.

QIS was designed using the same software platform, QED.NET, as the company’s metrology and newest magnetorheological finishing systems, which enables seamless communications between systems. These features result in ease of use, efficient processing, increased accuracy and expanded capabilities.

QIS is available on the new ASI(Q) platform, or as a field upgrade to existing ASI and SSI-A platforms.


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AmericasASI(Q) platformCommunicationsfield upgrade ASI platformfield upgrade SSI-A platformimagingmeasure short-radii partsmeasurements high fringe densitiesmetrologymetrology systemNew ProductsNew YorkProductsQED Interferometer for StitchingQED Interferometer for Stitching coherent imaging systemQED TechnologiesQED.NET softwareQIS systemTest & Measurement

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