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JEOL USA Inc.
Since its introduction in 2008, JEOL USA Inc.’s NeoScope benchtop scanning electron microscope (SEM) has been used for inspection of electronic parts, forensics analysis, pharmaceutical inspection and imaging insects for student projects. It is also used in conjunction with optical microscopes and traditional SEMs in the lab. Now available with higher magnification, multitouch screen control and a sleek new design, it is as simple to use as a digital camera. The high-resolution SEM produces images with a large depth of field at magnifications ranging from 10× to...See full product

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