Request InfoRudolph Technologies Inc.FLANDERS, N.J., Aug. 8, 2012 — Rudolph Technologies Inc.’s MetaPULSE FP thin-film metrology system is used by manufacturers of flat panel displays for handheld mobile devices, such as tablets, electronic book e-readers and smartphones. The system uses proprietary PULSE (picosecond ultrasonic laser sonar) technology to measure the critical thickness of metal layers deposited during the manufacturing process. The system enables measurement on actual product structures without contacting or destroying the device. PULSE technology’s ability to provide noncontact, nondestructive, on-product measurements...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 3/28/2024Smartphone Image SensorThe OV50K40 from OMNIVISION is a smartphone image sensor with the company’s TheiaCel™ high dynamic range technology with single exposure. 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