Silicon Drift Detector/Sample Viewport
Aug 2012EDAX Inc., Materials Analysis Div.Request Info
MAHWAH, N.J., Aug. 20, 2012 — Edax Inc. has introduced detector and sample viewport options for its Orbis micro-XRF (x-ray fluorescence) elemental analyzer system. The thermoelectrically cooled 50-mm2 silicon drift detector (SDD) performs high-resolution spectral acquisition at high count rates.
In applications where the detector is signal-starved, the new detector can collect the same spectral data in half the time of a standard Orbis 30 mm2 SDD. And in applications where the standard SDD detector is signal-saturated, the new detector can reduce the x-ray tube current, extending tube life.
It is useful for customers who make measurements on small fragments; on coatings and deposits on thin substrates, such as ink on paper; on biological samples; and on trace element analysis using heavier filters to improve sensitivity.
The company also has introduced a sample viewport mounted into the chamber door of the Orbis analyzer. The large, x-ray-safe window allows an analyst to verify general sample targeting among many small samples or among multiple sample trays. If the sample is large, the analyst can view its orientation on the stage or its position with respect to the surrounding sample chamber walls.
The viewport allows analysts to maintain eye contact and quickly understand the orientation of larger, high-value specimens inside the sample chamber during analysis.