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Polarization Measurement System
Sep 2012
General Photonics Corp.Request Info
CHINO, Calif., Sept. 4, 2012 — General Photonics Corp. has announced a new version of its PolaWise polarization measurement system, which characterizes all polarization-related properties of light sources and optical materials, including state of polarization, degree of polarization, polarization mode dispersion (PMD), polarization-dependent loss (PDL) and polarization extinction ratio (PER). It repeatably measures PMD in the femtosecond range. Previously, it was available only for the 1440- to 1620-nm wavelength range; the new model covers the 1280- to 1340-nm range.

Based on proprietary and patented magneto-optic polarization generation and analysis technology, the PSGA-101-A is designed to perform multiple functions in fiber optic applications, including polarization state generation. It features a large flip-top graphic LCD design that yields a large viewing area on a compact, portable enclosure.

A 2 × 20 character front panel LCD is included for applications that do not require a graphic display, such as PER measurement. The device’s internal tunable laser enables PDL and PMD measurement up to 10 ps. The system can control tunable lasers from third parties via a general-purpose interface bus port for measurement of larger PMD values.

A VGA port allows the use of an external LCD graphic display of the user’s choice. 


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optical materials
Materials that, by virtue of their optical characteristics (i.e. refractive index, dispersion,  etc.), are used in optical elements. See crystal; glass; plastic lens.
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