Surface Measuring System
Oct 2012Fries Research & Technology (FRT) GmbHRequest Info
BERGISCH GLADBACH, Germany, Oct. 7, 2012 — Fries Research and Technology GmbH’s MicroScope WLI (white light interferometry) is a surface measuring system based on an optical microscope. It is supplied with a full white light interferometer for nondestructive measurement, enabling 3-D measurements on a surface with high vertical resolution.
The compact surface metrology system includes an optical microscope with a fourfold turret equipped with a piezoelectric drive for the WLI objective. It is used for R&D and university biology and medical laboratories, and it provides information about roughness, step height, profiles and 3-D structures.
The motorized X-Y stage has a travel range of 100 × 100 mm. The axial measurement range is 400 µm. The system includes a PC with proprietary Mark III software for profile and topography analysis and data evaluation; and a number of 2- and 3-D filters. Average measurement time is a few seconds.
In addition to the interferometer objectives, three standard microscope objectives may be mounted.