Request InfoFormFactorFries Research and Technology GmbH’s MicroScope WLI (white light interferometry) is a surface measuring system based on an optical microscope. It is supplied with a full white light interferometer for nondestructive measurement, enabling 3-D measurements on a surface with high vertical resolution. The compact surface metrology system includes an optical microscope with a fourfold turret equipped with a piezoelectric drive for the WLI objective. It is used for R&D and university biology and medical laboratories, and it provides information about roughness, step height, profiles...See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 2/29/20243D Measuring DeviceThe FocusX from Bruker Alicona is an optical 3D measuring device meant for applications where highly reflective surfaces, steep flanks, and complex forms must be measured. 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