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SR-3501 and SR-1901 Spectroradiometers

Photonics.com
Oct 2012
Spectral Evolution Inc.Request Info
 
LAWRENCE, Mass., Oct. 31, 2012 — Spectral Evolution’s SR-3501 and SR-1901 spectroradiometers offer full-range UV/VIS/NIR capabilities for solar irradiance measurement and solar simulator classification; metrology of films, filters and optical components; and LED metrology.

The SR-3501 and SR-1901 provide 280- to 2500-nm and 280- to 1900-nm capabilities, respectively, for researchers working in applications in solar irradiance measurements and solar simulator spectral match classification; LED metrology; semiconductor thin-film thickness metrology; and absorbance chemistry and fluorimetry for kinetic studies.

Both instruments feature full-range UV/VIS/NIR/short-wavelength IR measurement with just one scan, in a single box; InGaAs and Si photodiode arrays and fixed optics for reliable operation without moving gratings or internal fiber optics; autoexposure, autoscaling and auto dark shutter for fast, accurate scans; NIST-traceable calibration; and a compact, lightweight design that is easy to set up and use.

They are supplied with the DARWin SP data analysis software so users can validate the spectral match class of any commercially available continuous-output solar simulator, per IEC 60904-9/ASTM E927-05; plot data and review results in radiometric or photometric units; compare current scans against libraries; calculate and plot chromaticity coordinates and diagrams; and automatically save data as an ASCII file to third-party software. No extra export function is necessary.

Single and multiple spectral plots are available.

The SR-3501 and SR-1901 can be ordered with a range of optics choices, including fiber optics with right-angle diffusers, direct-mounted integrating spheres and field-of-view lenses.


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absorbance chemistryAmericasauto dark shutterautoexposureautoscalingBasic ScienceDARWin SP data analysis softwareenergyfluorimetryIEC 60904-9/ASTM E927-05InGaAs photodiode arrayLED metrologyMassachusettsmetrologymetrology of filmsmetrology of filtersmetrology of optical componentsNIST-traceable calibrationProductsSi photodiode arraysolar irradiance measurementsolar simulator classificationSpectral EvolutionspectroradiometersSR-1901SR-3501Test & Measurement

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