Request InfoQuartz Imaging Corp.VANCOUVER, British Columbia, Canada, Nov. 7, 2012 — Quartz Imaging Corp. has launched its SEM (scanning electron microscope) sharpness measurement tool. Based on ISO standards, this new feature included in Quartz PCI version 9 software works with a single image or a group of images. SEM images can be measured regularly to monitor the performance of an SEM, and a detailed report including all images, their sharpness measurement results and polar plots showing the sharpness value vs. angle can be generated in just a few clicks. Regular sharpness (resolution) measurements can identify when an SEM is in need of service. 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