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Ultrafast Surface and Wavefront Measurement

Photonics.com
Jan 2013
TRIOPTICS GmbHRequest Info
 
WEDEL, Germany, Jan. 7, 2013 — The new µPhase PRO Workshop interferometer from Trioptics GmbH measures surface and wavefront aberrations in a matter of seconds.

The simple handling, the integrated alignment mode and the short measurement time create a device that is suitable for in-line measurement of plane and spherical samples.

Besides the visual fringe analysis, measurement/analysis software is available as an upgrade.


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µPhase PRO WorkshopEuropeGermanyin-line measurementintegrated alignment modeinterferometermeasurement and analysis softwareplane samplesProductsspherical samplessurface aberrationsTest & MeasurementTriopticsvisual fringe analysiswavefront aberrations

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