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Nanoscan 2 Scanning Slit Laser Beam Profiler

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MKS Ophir, Light & Measurement
NORTH LOGAN, Utah, Feb. 19, 2013 — Ophir Photonics has announced the NanoScan 2 scanning slit laser beam profiler. NIST-calibrated, it measures continuous-wave and pulsed beams from the UV to the far-infrared. It features a USB 2.0 interface that provides deep, 12-bit digitization of the signal for enhanced dynamic range up to 35 dB of power. An enhanced digital controller improves the accuracy and stability of measurements. Beam size and beam pointing can be measured with a three-sigma precision of several hundred nanometers. Features include software-controllable scan speed and a “peak connect” algorithm...See full product

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