Mar 2013Bruker Nano SurfacesRequest Info
TUCSON, Ariz., March 27, 2013 — Bruker Corp. has released the ContourGT-K, the latest addition to its ContourGT line of 3-D optical microscopes The scalable device features patented, higher-brightness dual-LED illumination and vertical resolution for uncompromised benchtop metrology applications.
The optical microscope delivers Z-axis resolution across all fields of view and 2- and 3-D imaging capability for noncontact profile, roughness and thickness measurements on a wide range of surfaces. The system’s gage-capable, streamlined design includes integrated air isolation for robust vibration tolerance in challenging production environments.
The instrument incorporates Bruker Vision64 software and a library of preprogrammed filters and analyses for access to advanced measurements for LED, solar cell, thick-film, semiconductor, ophthalmic, medical device, microelectromechanical systems and tribology applications.
Factory- and field-upgradable add-ons such as application-specific productivity software, automated turret, stages and tilt functions, color and high-resolution camera options and proprietary NanoLens atomic force microscope modules also are available.