Atomic Force Microscope
Sep 2013Asylum ResearchRequest Info
SANTA BARBARA, Calif., May 22, 2013 — Asylum Research’s new MFP-3D Origin atomic force microscope (AFM) has full upgrade potential to the MFP-3D and its complete range of environmental and advanced application accessories.
The MFP-3D features closed-loop precision, high-resolution imaging and low-noise force measurements. The MFP-3D Origin includes advanced modes such as nanolithography, the proprietary Dual AC mode and piezoresponse force microscopy. Additional advanced functionality is available for optional modes such as conductive AFM, AM-FM viscoelastic mapping for nanomechanical analysis, scanning tunnelling microscopy and scanning thermal microscopy.