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Extended-Range Dual-AR Technology

Photonics Spectra
Dec 2013
Andor Technology Ltd., Corporate HeadquartersRequest Info
BELFAST, Northern Ireland, July 10, 2013 — Andor Technology plc has released extended-range Dual-AR technology for its iKon-M CCD platform, offering broad and high-quantum-efficiency spectral response coverage from the UV to near-IR in one camera.

Available on the 1-megapixel iKon-M 934 CCD platform, the technology broadens the quantum efficiency range of back-illuminated, deep-depletion sensors through implementation of a dual antireflection coating process on enhanced silicon developed by sensor manufacturer e2v. The advancement delivers ~90% or greater quantum efficiency in the 400- to 850-nm range. Proprietary Fringe Suppression Technology minimizes etaloning in the near-IR region.

The technology is suitable for long-exposure broadband applications such as luminescence microscopy and astronomy, and for ultracold-matter labs that study a range of atoms and ions.


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The scientific observation of celestial radiation that has reached the vicinity of Earth, and the interpretation of these observations to determine the characteristics of the extraterrestrial bodies and phenomena that have emitted the radiation.
A phenomenon that degrades the performance of thinned, back-illuminated CCDs. The effect is caused by lightwaves passing through the CCD and reflected at the rear surface, producing interference fringes when they interact with incoming waves.
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